ECE 5820 - Digital System Testing (3)

Basic theories and techniques for testing digital systems. Test generation for combinational and sequential logic circuits, Fault Modeling, Fault Simulation, Testing for stuck faults, Automatic Test Generation, Design for Testability (DFT), Built-In-Self-Test (BIST) and Diagnosis, Boundary Scan and Core-Based Testing.

Prerequisite(s): ECE Majors; and ECE 3300 or equivalent.
Component(s): Lecture
Grading Basis: Graded Only
Repeat for Credit: May be taken only once